Hitachi TM3000 Benchtop Scanning Electron Microscope

Photos of and by NIWA's new benchtop Hitachi TM3000 Benchtop Scanning Electron Microscope (SEM) .  This compact SEM is easy to use compared to traditional SEMs and allows for observation of uncoated specimens in low vacuum mode. For more information, see our page on the SEM.

Photos of and by NIWA's new benchtop Hitachi TM3000 Benchtop Scanning Electron Microscope (SEM) .  This compact SEM is easy to use compared to traditional SEMs and allows for observation of uncoated specimens in low vacuum mode. For more information, see our page on the SEM.

Click on the image titles to learn more about them.